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FACILITIES
MATERIALS
CHARACTERIZATION FACILITY
| This centralized,
common-purpose, multi-user facility is for the characterization
of materials using modern analytical instruments including an
ISI-60A scanning electron microscope equipped with EDAX, an
ESCA/Auger spectrometer (Perkin Elmer) for surface analysis
and compositional profiling, a high resolution STEM (JEOL-2010CX),
a micro-hardness tester (Knoop and Vickers), a Gatan ion milling
System and dimpler, and a Tenupol electropolishing system for
preparation of electron microscopy samples, metallography microscopes
and furnaces, and a hydraulic Instron mechanical testing system.
Facilities available on campus for materials characterization
also include, X-ray diffractometers (Siemens), FTIR spectroscope
and atomic force microscopy instruments, and EXAFS facility
at the synchrotron beam line at CAMD. |
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